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Local versus global electronic properties of chalcopyrite alloys: X-ray absorption spectroscopy and ab initio calculations

机译:黄铜矿合金的局部和整体电子性能:X射线吸收光谱和从头算

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摘要

Structural and electronic properties of Cu(In,Ga)S2 (CIGS) alloys as a function of the In/Ga ratio are studied by combining near edge X-ray absorption fine structure and extended X-ray absorption fine structure spectroscopy with density functional theory calculations. While the S absorption edge shifts with the change of the In/Ga ratio, consistently with the corresponding variation of the band gap, the edges of the other elements are largely independent of composition. Our calculations reproduce this behavior and identify its origin in the dependence of the electronic properties on the local atomic environment. These results point to the importance of an accurate atomic-scale description of the structure of this family of alloys for reliable calculations of their electronic properties.
机译:通过将近边缘X射线吸收精细结构和扩展X射线吸收精细结构光谱与密度泛函理论相结合,研究了Cu(In,Ga)S2(CIGS)合金的结构和电子性能随In / Ga比变化的关系计算。当S吸收边缘随In / Ga比的变化而移动时,与带隙的相应变化一致,而其他元素的边缘在很大程度上与组成无关。我们的计算重现了这种行为,并根据电子特性对局部原子环境的依赖来确定其起源。这些结果表明,对该族合金的结构进行准确的原子级描述对于其电子性能的可靠计算非常重要。

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